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Patent Application Information Retrieval (PAIR) is an online service provided by the United States Patent and Trademark Office to allow users to see the prosecution histories of United States patents and patent applications and obtain copies of documents filed therein. There are two services: Public PAIR, which allows the general public to ...
The information submitted in an IDS typically includes other issued patents, published patent applications, scientific journal articles, books, magazine articles, or any other published material that is relevant to the invention disclosed in the applicant's own patent application, irrespective of the country or language in which the published material was made.
The Global Dossier is an online public service launched in June 2014 by the five "IP5" offices, i.e. the European Patent Office (EPO), the Japan Patent Office (JPO), the Korean Intellectual Property Office (KIPO), China's National Intellectual Property Administration (CNIPA) and the US Patent and Trademark Office (USPTO), to offer an integrated access to the respective "file wrappers", free of ...
PATENTSCOPE provides access to millions of patent documents from around the world. It is the official publication reference site for published PCT applications. It includes patent applications, granted patents, and related technical information from national and international patent offices. The database covers a broad range of technology ...
A standard patent application is a patent application containing all of the necessary parts (e.g. a written description of the invention and claims) that are required for the grant of a patent. A standard patent application may or may not result in the grant of a patent depending upon the outcome of an examination by the patent office it is ...
The Manual of Patent Examining Procedure (MPEP) is published by the United States Patent and Trademark Office (USPTO) for use by patent attorneys and agents and patent examiners. It describes all of the laws and regulations that must be followed in the examination of U.S. patent applications , and articulates their application to an enormous ...
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