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Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe.
From left to right shows images of increasing magnification where the scale bar in the first image is 50 μm and in the third is 200 nm. The first image shows the substrate, cantilever and the tip whereas the second image shows the tip geometry whilst the last image shows the tip apex and demonstrates the fine point that is achieved e.g. radius ...
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
In AFM-IR, an AFM probe is used to measure the absorption response of the sample to infrared radiation. The general approach for AFM/FTIR is shown in Figure 10. [60] Figure 10. General approach used for AFM-FTIR. The output from the probe resembles an interferogram and is Fourier-transformed to obtain the infrared absorption spectrum of the sample.
It is commonly utilized in device failure analysis laboratories to aid with yield enhancement, quality and reliability issues and customer returns. Commercially available nanoprobing systems are integrated into either a vacuum-based scanning electron microscope (SEM) or atomic force microscope (AFM). Nanoprobing systems that are based on AFM ...
Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
In AFM, feedback loops control the operation of the microscope by keeping a fixed value a parameter of the tip's oscillation. [11] If the main feedback loop operates with the amplitude, the AFM mode is called amplitude modulation (AM). If it operates with the frequency shift, the AFM mode is called frequency modulation (FM).