enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a ...

  3. Colloidal probe technique - Wikipedia

    en.wikipedia.org/wiki/Colloidal_probe_technique

    Scheme of the colloidal probe technique for direct force measurements in the sphere-plane and sphere-sphere geometries. The colloidal probe technique is commonly used to measure interaction forces acting between colloidal particles and/or planar surfaces in air or in solution. This technique relies on the use of an atomic force microscope (AFM).

  4. Interface force field - Wikipedia

    en.wikipedia.org/wiki/Interface_force_field

    A major obstacle was the poor definition of atomic charges in molecular models, especially for inorganic compounds, due to reliance on quantum chemistry calculations and partitioning methods that may be suitable for field-based but not for point-based charge distributions necessary in force fields.

  5. Infrared Nanospectroscopy (AFM-IR) - Wikipedia

    en.wikipedia.org/wiki/Infrared_Nanospectroscopy...

    Atomic force microscope inside a FTIR spectrometer with the optical interface. The earliest measurements combining AFM with infrared spectroscopy were performed in 1999 by Hammiche et al. at the University of Lancaster in the United Kingdom, [1] in an EPSRC-funded project led by M Reading and H M Pollock.

  6. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...

  7. Bimodal atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Bimodal_atomic_force...

    Bimodal Atomic Force Microscopy (bimodal AFM) is an advanced atomic force microscopy technique characterized by generating high-spatial resolution maps of material properties. Topography, deformation, elastic modulus, viscosity coefficient or magnetic field maps might be generated.

  8. Force spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Force_spectroscopy

    Force spectroscopy is a set of techniques for the study of the interactions and the binding forces between individual molecules. [1] [2] These methods can be used to measure the mechanical properties of single polymer molecules or proteins, or individual chemical bonds.

  9. Force field (chemistry) - Wikipedia

    en.wikipedia.org/wiki/Force_field_(chemistry)

    Part of force field of ethane for the C-C stretching bond. In the context of chemistry, molecular physics, physical chemistry, and molecular modelling, a force field is a computational model that is used to describe the forces between atoms (or collections of atoms) within molecules or between molecules as well as in crystals.