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Thermal polymer decomposition. Thermal scanning probe lithography (t-SPL) is a form of scanning probe lithography [1] (SPL) whereby material is structured on the nanoscale using scanning probes, primarily through the application of thermal energy.
Thermochemical nanolithography (TCNL) or thermochemical scanning probe lithography (tc-SPL) is a scanning probe microscopy-based nanolithography technique which triggers thermally activated chemical reactions to change the chemical functionality or the phase of surfaces.
Scanning probe lithography [1] (SPL) describes a set of nanolithographic methods to pattern material on the nanoscale using scanning probes. It is a direct-write, mask-less approach which bypasses the diffraction limit and can reach resolutions below 10 nm. [ 2 ]
Solid-solid conduction. Probe tip to sample. This is the transfer mechanism which yields the thermal scan. Liquid-liquid conduction. When scanning in non-zero humidity, a liquid meniscus forms between the tip and sample. Conduction can occur through this liquid drop. Gas conduction. Heat can be transferred through the edges of the probe tip to ...
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.
Electro Scan was founded in October 2011 by Chuck Hansen in Sacramento, California. [4] In 2012, the Water Environment Research Foundation approved a testing project in Wauwatosa, Wisconsin, in which the company used its technology to check non-conductive sewer pipes that had previously been inspected for leaks using other methods. [5]
Differential scanning calorimetry (DSC) is a thermoanalytical technique in which the difference in the amount of heat required to increase the temperature of a sample and reference is measured as a function of temperature. [1] Both the sample and reference are maintained at nearly the same temperature throughout the experiment.
An RF admittance level sensor uses a rod probe and RF source to measure the change in admittance. The probe is driven through a shielded coaxial cable to eliminate the effects of changing cable capacitance to ground. When the level changes around the probe, a corresponding change in the dielectric is observed.