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Iron(III) phosphate or ferric phosphate [4] [5] is an inorganic compound with the formula Fe PO 4. Four polymorphs of anhydrous FePO 4 are known. Additionally, two polymorphs of the dihydrate FePO 4 ·(H 2 O) 2 are known.
Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [3] X-ray standing waves, another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry. [4]
Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions.
An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.
One peak is from the L shell of iron. Energy-dispersive X-ray spectroscopy ( EDS , EDX , EDXS or XEDS ), sometimes called energy dispersive X-ray analysis ( EDXA or EDAX ) or energy dispersive X-ray microanalysis ( EDXMA ), is an analytical technique used for the elemental analysis or chemical characterization of a sample .
X-ray crystal truncation rod scattering is a powerful method in surface science, based on analysis of surface X-ray diffraction (SXRD) patterns from a crystalline surface. For an infinite crystal, the diffracted pattern is concentrated in Dirac delta function like Bragg peaks.
This is an X-ray diffraction pattern formed when X-rays are focused on a crystalline material, in this case a protein. Each dot, called a reflection, forms from the coherent interference of scattered X-rays passing through the crystal.