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Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.
Parts books were often issued as microfiche, though this has fallen out of favour. Now, many manufacturers offer this information digitally in an electronic parts catalogue. This can be locally installed software, or a centrally hosted web application. Usually, an electronic parts catalogue enables the user to virtually disassemble the product ...
Advanced Tester Resource Enhancement (ATRE) [5] is a powerful means of increasing the number of DUTs that can be tested by a probe card in parallel (or in one touchdown during which probe card needles remain in contact with the wafer DUTs). ATRE allows the sharing of tester resources among DUTs using active components, which have the ability to ...
Typical passive oscilloscope probe being used to test an integrated circuit. A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods ...
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
Dragonfly - Embedded test IP insertion tool for logic, memory and mixed-signal testing; Silicon Insight - Interactive program that works with 3rd party testers for controlling and logging of data on the device for at-speed testing; Yield Insight - Yield analysis program which looks at foundry and performance data to diagnose possible problems
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