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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
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X-ray reflectometry: is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. Propagation of electric pulses and reflection at discontinuities in cables is used in time domain reflectometry (TDR) to detect and localize defects in electric wiring. [2] [3]
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
The X-ray standing wave (XSW) technique can be used to study the structure of surfaces and interfaces with high spatial resolution and chemical selectivity. Pioneered by B.W. Batterman in the 1960s, [1] the availability of synchrotron light has stimulated the application of this interferometric technique to a wide range of problems in surface science.
English: This is a simple diagram illustrating how X-ray magnetic circular dichroism (XMCD) works. XMCD is an experimental physics technique used at synchrotrons for studying magnetic materials. XMCD is an experimental physics technique used at synchrotrons for studying magnetic materials.
X-ray reflectivity, yet another related technique, but here the intensity of the specular reflected beam is measured. [ 6 ] [ 7 ] [ 8 ] Grazing incidence atom scattering, [ 9 ] [ 10 ] where the fact that atoms (and ions) can also be waves is used to diffract from surfaces.
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