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Hardware testing file formats (1 P) Pages in category "Hardware testing" The following 46 pages are in this category, out of 46 total. This list may not reflect ...
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.
The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.
Hardware-in-the-loop (HIL) simulation, also known by various acronyms such as HiL, HITL, and HWIL, is a technique that is used in the development and testing of complex real-time embedded systems. HIL simulation provides an effective testing platform by adding the complexity of the process-actuator system, known as a plant , to the test platform.
The hardware fault injection method consists in real electrical signals injection into the DUT (devices under testing) in order to disturb it, supposedly well working, at hardware low level, and deceive the control - detection chain (if present) in order to see how and if the fault management strategy is implemented.
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity, often to a breaking point, in order to observe the results.
Test methods also specify test equipment to be used in the performance of the tests and establish pass/fail criteria. Test methods used to verify hardware design requirements can range from very simple steps, such as visual inspection, to elaborate test procedures that are documented separately.
For explosive devices, test requirements and methods are tailored from MIL-HDBK-1512 and NATO AOP-7. For batteries, guidance on test requirements is in RCC-Doc-319-99. Note: Surveillance Testing is a periodic repeat of the Acceptance Testing using trending or accelerated aging to authorize shelf life extensions.