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Hardware testing file formats (1 P) Pages in category "Hardware testing" The following 46 pages are in this category, out of 46 total. This list may not reflect ...
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.
Hardware-in-the-loop (HIL) simulation, also known by various acronyms such as HiL, HITL, and HWIL, is a technique that is used in the development and testing of complex real-time embedded systems. HIL simulation provides an effective testing platform by adding the complexity of the process-actuator system, known as a plant , to the test platform.
The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.
The hardware fault injection method consists in real electrical signals injection into the DUT (devices under testing) in order to disturb it, supposedly well working, at hardware low level, and deceive the control - detection chain (if present) in order to see how and if the fault management strategy is implemented.
Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity, often to a breaking point, in order to observe the results.
HALT is a test technique called test-to-fail, where a product is tested until failure. HALT does not help to determine or demonstrate the reliability value or failure probability in field. Many accelerated life tests are test-to-pass, meaning they are used to demonstrate the product life or reliability.