enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. Near-field scanning optical microscope - Wikipedia

    en.wikipedia.org/wiki/Near-field_scanning...

    Here, λ 0 is the wavelength in vacuum; NA is the numerical aperture for the optical component (maximum 1.3–1.4 for modern objectives with a very high magnification factor). Thus, the resolution limit is usually around λ 0 /2 for conventional optical microscopy. [17]

  3. Environmental scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Environmental_scanning...

    The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber.

  4. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  5. Scanning helium ion microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_Helium_Ion_Microscope

    As the helium ion beam interacts with the sample, it does not suffer from a large excitation volume, and hence provides sharp images with a large depth of field on a wide range of materials. Compared to a SEM, the secondary electron yield is quite high, allowing for imaging with currents as low as 1 femtoamp. The detectors provide information ...

  6. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    Above the sample, the wave of an electron can be approximated as a plane wave incident on the sample surface. As it penetrates the sample, it is attracted by the positive atomic potentials of the atom cores, and channels along the atom columns of the crystallographic lattice (s-state model [4]).

  7. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

  8. College Football Playoff: Which teams are in position for the ...

    www.aol.com/sports/college-football-playoff...

    The College Football Playoff cake is getting close to baked, which means much of the angst and anger of the past few weeks over hypothetical and projected scenarios have proved a waste of time.

  9. X-ray microscope - Wikipedia

    en.wikipedia.org/wiki/X-ray_microscope

    It is a contrast imaging technology using the difference in absorption of soft X-rays in the water window region (wavelengths: 2.34–4.4 nm, energies: 280–530 eV) by the carbon atom (main element composing the living cell) and the oxygen atom (an element of water). Microfocus X-ray also achieves high magnification by projection. A microfocus ...