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High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [ 1 ] [ 2 ] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2 -bonded carbon (e.g ...
A single, tiny source of light can be located much better than the resolution of a microscope usually allows for: although the light will produce a blurry spot, computer algorithms can be used to accurately calculate the center of the blurry spot, taking into account the point spread function of the microscope, the noise properties of the ...
For example, an electron at an energy of 10 keV has a wavelength of 0.01 nm, allowing the electron microscope (SEM or TEM) to achieve high resolution images. Other massive particles such as helium, neon, and gallium ions have been used to produce images at resolutions beyond what can be attained with visible light.
A 1951 USAF resolution test chart is a microscopic optical resolution test device originally defined by the U.S. Air Force MIL-STD-150A standard of 1951. The design provides numerous small target shapes exhibiting a stepped assortment of precise spatial frequency specimens.
Crystallographic Image Processing (CIP) of a high-resolution electron microscopy (HREM) image of α-Ti 2 Se recorded with a 300 kV TEM (JEOL 3010 UHR, point resolution 1.7 Å) along the [001] zone axis. In the first step the Fourier transform of the HREM image is calculated (only the amplitudes are shown).
In a dry objective or condenser, this gives a maximum NA of 0.95. In a high-resolution oil immersion lens, the maximum NA is typically 1.45, when using immersion oil with a refractive index of 1.52. Due to these limitations, the resolution limit of a light microscope using visible light is about 200 nm.
Also common in the microscopy literature is a formula for resolution that treats the above-mentioned concerns about contrast differently. [2] The resolution predicted by this formula is proportional to the Rayleigh-based formula, differing by about 20%. For estimating theoretical resolution, it may be adequate.
Geometric phase analysis is a method of digital signal processing used to determine crystallographic quantities such as d-spacing or strain from high-resolution transmission electron microscope images. [1] [2] The analysis needs to be performed using specialized computer program.
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