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X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.
As with other diffraction methods, the sample is scanned in a wide-angle X-ray goniometer, and the scattering intensity is plotted as a function of the 2θ angle. X-ray diffraction is a non destructive method of characterization of solid materials.
Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects. In 2020, the ICDD and the Cambridge Crystallographic Data Centre, which curates and maintains the Cambridge Structural Database, announced a data partnership.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.
The most common powder X-ray diffraction (XRD) refinement technique used today is based on the method proposed in the 1960s by Hugo Rietveld. [2] The Rietveld method fits a calculated profile (including all structural and instrumental parameters) to experimental data.
While WDS is slower than EDS and more sensitive to the positioning of the sample in the spectrometer, it has superior spectral resolution and sensitivity. WDS is widely used in microprobes (where X-ray microanalysis is the main task) and in XRF; it is widely used in the field of X-ray diffraction to calculate various data such as interplanar ...
One drawback of many configurations is that the sample must be moved in order to use other surface analysis methods such as LEED or AES, and after moving the sample back into the X-ray diffraction position, it must be realigned. In some setups, the sample chamber can be detached from the diffractometer without breaking vacuum, allowing for ...
This reciprocal space diffraction image was taken by Ian Robinson's Group to be used in the reconstruction of a real space coherent X-ray diffraction image in 2007. Coherent diffractive imaging ( CDI ) is a "lensless" technique for 2D or 3D reconstruction of the image of nanoscale structures such as nanotubes, [ 1 ] nanocrystals, [ 2 ] porous ...