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Industrial Optical Metrology Systems (ATOS) from GOM GmbH utilize Structured Light technology to achieve high accuracy and scalability in measurements. These systems feature self-monitoring for calibration status, transformation accuracy, environmental changes, and part movement to ensure high-quality measuring data.
Creaform manufactures metrology and 3D engineering devices for use in shop-floor environments [93] It is based in Lévis, Quebec, Canada. The company was founded in 2002 by Martin Lamontagne and two co-workers at Modelex. [94] It began with a $200,000 loan from the Business Development Bank of Canada. [94]
Metrology is the science of measurement and its application. [1] Main articles ... and spatial orientation of the Earth in temporally varying 3D. List of geodesists;
As the output of 3D scanning processes, point clouds are used for many purposes, including to create 3D computer-aided design (CAD) or geographic information systems (GIS) models for manufactured parts, for metrology and quality inspection, and for a multitude of visualizing, animating, rendering, and mass customization applications.
Some of the key uses for industrial CT scanning have been flaw detection, failure analysis, metrology, assembly analysis and reverse engineering applications. [ 1 ] [ 2 ] Just as in medical imaging , industrial imaging includes both nontomographic radiography ( industrial radiography ) and computed tomographic radiography (computed tomography).
Probing systems for microscale metrology applications are another emerging area. [6] [7] There are several commercially available coordinate measuring machines that have a microprobe integrated into the system, several specialty systems at government laboratories, and any number of university-built metrology platforms for microscale metrology ...
In short, it is a web and computer program that takes satellite images, aerial photography, and GIS (Geographic Information System) data and superimposes all of this on a 3D globe. This then ...
As described here, white light interferometry is a non-contact optical method for surface height measurement on 3D structures with surface profiles varying between tens of nanometers and a few centimeters.