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  2. FormFactor, Inc. - Wikipedia

    en.wikipedia.org/wiki/FormFactor,_Inc.

    The company completed an initial public offering (IPO) on the Nasdaq as FORM, [2] in June 2003 with 6 million shares priced at $14. [3] [4] FormFactor released the first x64 DRAM probe card in 2000, [5] followed by the x128 DRAM probe card in 2002. [6] [7] The company shipped the first SmartMatrix full-wafer probe cards in February 2009. [8]

  3. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Use and manufacture. A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE .

  4. FormFactor (FORM) Boosts Probe Card Efforts With New Facility

    www.aol.com/news/formfactor-form-boosts-probe...

    FormFactor (FORM) announces the opening of a new probe card manufacturing facility in Livermore, CA, in a bid to bolster its presence in the United States.

  5. Technoprobe - Wikipedia

    en.wikipedia.org/wiki/Technoprobe

    Displaying remarkable ingenuity, Crippa devised a method to manufacture probe cards in his kitchen, circumventing the lengthy repair processes often associated with such components. Over the subsequent 27 years, Technoprobe burgeoned into one of the premier manufacturers of probe cards globally, catering to esteemed clients like Apple, Qualcomm ...

  6. Non-contact wafer testing - Wikipedia

    en.wikipedia.org/wiki/Non-contact_wafer_testing

    the probe card may be damaged from repeated contact, or become contaminated with debris created by contact with the wafer the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after packaging ...

  7. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or ...

  8. Small Form-factor Pluggable - Wikipedia

    en.wikipedia.org/wiki/Small_Form-factor_Pluggable

    Small Form-factor Pluggable connected to a pair of fiber-optic cables. Small Form-factor Pluggable (SFP) is a compact, hot-pluggable network interface module format used for both telecommunication and data communications applications. An SFP interface on networking hardware is a modular slot for a media-specific transceiver, such as for a fiber ...

  9. Form factor (design) - Wikipedia

    en.wikipedia.org/wiki/Form_factor_(design)

    Form factor is a hardware design aspect that defines and prescribes the size, shape, and other physical specifications of components, particularly in electronics. [1][2] A form factor may represent a broad class of similarly sized components, or it may prescribe a specific standard. It may also define an entire system, as in a computer form factor.