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Fugacity and BCF relate to each other in the following equation: = [6] where Z Fish is equal to the Fugacity capacity of a chemical in the fish, P Fish is equal to the density of the fish (mass/length 3), BCF is the partition coefficient between the fish and the water (length 3 /mass) and H is equal to the Henry's law constant (Length 2 /Time 2) [6]
Fluorescence-lifetime imaging microscopy or FLIM is an imaging technique based on the differences in the exponential decay rate of the photon emission of a fluorophore from a sample. It can be used as an imaging technique in confocal microscopy, two-photon excitation microscopy, and multiphoton tomography. The fluorescence lifetime (FLT) of the ...
Survival analysis is a branch of statistics for analyzing the expected duration of time until one event occurs, such as death in biological organisms and failure in mechanical systems. This topic is called reliability theory, reliability analysis or reliability engineering in engineering, duration analysis or duration modelling in economics ...
Thirty-three percent of workers earning between $50,000 and $79,999 annually say they’re living paycheck to paycheck, compared to 36 percent of workers earning between $80,000 and $99,999 and 24 ...
The Variant Call Format or VCF is a standard text file format used in bioinformatics for storing gene sequence variations. The format was developed in 2010 for the 1000 Genomes Project and has since been used by other large-scale genotyping and DNA sequencing projects. [ 1][ 2] VCF is a common output format for variant calling programs due to ...
In thermodynamics, the Volume Correction Factor (VCF), also known as Correction for the effect of Temperature on Liquid (CTL), is a standardized computed factor used to correct for the thermal expansion of fluids, primarily, liquid hydrocarbons at various temperatures and densities. [1] It is typically a number between 0 and 2, rounded to five ...
Exponential decay is a scalar multiple of the exponential distribution (i.e. the individual lifetime of each object is exponentially distributed), which has a well-known expected value. We can compute it here using integration by parts .
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.