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When BIST is used in flight, a fault causes the system to switch to an alternative mode or equipment that still operates. Critical flight equipment is normally duplicated, or redundant. Less critical flight equipment, such as entertainment systems, might have a "limp mode" that provides some functions.
The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product.
An intelligent maintenance system is a system that uses data analysis and decision support tools to predict and prevent the potential failure of machines. The recent advancement in information technology, computers, and electronics have facilitated the design and implementation of such systems.
Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...
Self-Monitoring, Analysis, and Reporting Technology (S.M.A.R.T. or SMART) is a monitoring system included in computer hard disk drives (HDDs) and solid-state drives (SSDs). [3] Its primary function is to detect and report various indicators of drive reliability, or how long a drive can function while anticipating imminent hardware failures.
Built-in test equipment includes multimeters, oscilloscopes, discharge probes, and frequency generators that are provided as part of the system to enable testing and perform diagnostics. The acronym BIT is often used for this same function or, more specifically, in reference to the individual tests. BIT often includes: The detection of the fault
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Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.