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The two rows of holes (labelled #3) are test points used during the manufacture of this USB memory key. Testpoints on a printed circuit board (labelled E34, E35, E36, …) next to teardrop vias. A test point is a location within an electronic circuit that is used to monitor the state of the circuitry or inject test signals. [1]
Screenshot of Device Manager, containing a Qualcomm device booted in the Emergency Download Mode. The Qualcomm Emergency Download mode, commonly known as Qualcomm EDL mode and officially known as Qualcomm HS-USB QD-Loader 9008 [1] is a feature implemented in the boot ROM of a system on a chip by Qualcomm which can be used to recover bricked smartphones.
For the Vicat A test, a load of 10 N is used. For the Vicat B test, the load is 50 N. It is named after the French engineer Louis Vicat. Standards to determine Vicat softening point include ASTM D 1525 and ISO 306, which are largely equivalent. [1] The vicat softening temperature can be used to compare the heat-characteristics of different ...
The pattern deviation probability plot (or total deviation probability plot when MD is worse than -20 dB) is used to identify abnormal points and age corrected sensitivity at each point is calculated using total deviation numerical map. VFI is a reliable index on which glaucomatous visual field severity staging can be based. [22]
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