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ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
An example of data mining related to an integrated-circuit (IC) production line is described in the paper "Mining IC Test Data to Optimize VLSI Testing." [12] In this paper, the application of data mining and decision analysis to the problem of die-level functional testing is described. Experiments mentioned demonstrate the ability to apply a ...
The difference between data analysis and data mining is that data analysis is used to test models and hypotheses on the dataset, e.g., analyzing the effectiveness of a marketing campaign, regardless of the amount of data. In contrast, data mining uses machine learning and statistical models to uncover clandestine or hidden patterns in a large ...
Automatic item generation (AIG), or automated item generation, is a process linking psychometrics with computer programming. It uses a computer algorithm to automatically create test items that are the basic building blocks of a psychological test. The method was first described by John R. Bormuth [1] in the 1960s but was not developed until ...
gretl is an example of an open-source statistical package. ADaMSoft – a generalized statistical software with data mining algorithms and methods for data management; ADMB – a software suite for non-linear statistical modeling based on C++ which uses automatic differentiation; Chronux – for neurobiological time series data; DAP – free ...
KNIME (/ n aɪ m / ⓘ), the Konstanz Information Miner, [2] is a free and open-source data analytics, reporting and integration platform.KNIME integrates various components for machine learning and data mining through its modular data pipelining "Building Blocks of Analytics" concept.
Electronic design automation (EDA), also referred to as electronic computer-aided design (ECAD), [1] is a category of software tools for designing electronic systems such as integrated circuits and printed circuit boards. The tools work together in a design flow that chip designers use to design and analyze entire semiconductor chips.
Keithley Instruments Series 4200 CVU. Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results.
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related to: automated test generation tools examples in statistics and data mining