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  2. International Centre for Diffraction Data - Wikipedia

    en.wikipedia.org/wiki/International_Centre_for...

    It also publishes the journals Advances in X-ray Analysis and Powder Diffraction. In 2019, Materials Data, also known as MDI, merged with ICDD. Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects.

  3. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    The use of computational methods for the powder X-ray diffraction data analysis is now generalized. It typically compares the experimental data to the simulated diffractogram of a model structure, taking into account the instrumental parameters, and refines the structural or microstructural parameters of the model using least squares based ...

  4. Powder diffraction - Wikipedia

    en.wikipedia.org/wiki/Powder_diffraction

    This is directly related to the fact that information is lost by the collapse of the 3D space onto a 1D axis. Nevertheless, powder X-ray diffraction is a powerful and useful technique in its own right. It is mostly used to characterize and identify phases, and to refine details of an already known structure, rather than solving unknown structures.

  5. R-factor (crystallography) - Wikipedia

    en.wikipedia.org/wiki/R-factor_(crystallography)

    Crystallographers also use the Free R-Factor [3] to assess possible overmodeling of the data. R F r e e {\displaystyle R_{Free}} is computed according to the same formula given above, but on a small, random sample of data that are set aside for the purpose and never included in the refinement.

  6. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.

  7. List of materials analysis methods - Wikipedia

    en.wikipedia.org/wiki/List_of_materials_analysis...

    ENDOR – Electron nuclear double resonance, see ESR or EPR; EPMA – Electron probe microanalysis; EPR – Electron paramagnetic resonance spectroscopy; ERD or ERDA – Elastic recoil detection or elastic recoil detection analysis; ESCA – Electron spectroscopy for chemical analysis see XPS; ESD – Electron stimulated desorption

  8. Nuclear magnetic resonance spectroscopy of proteins

    en.wikipedia.org/wiki/Nuclear_magnetic_resonance...

    In order to analyze the nuclear magnetic resonance data, it is important to get a resonance assignment for the protein, that is to find out which chemical shift corresponds to which atom. This is typically achieved by sequential walking using information derived from several different types of NMR experiment.

  9. Grazing incidence diffraction - Wikipedia

    en.wikipedia.org/wiki/Grazing_incidence_diffraction

    Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [3] X-ray standing waves, another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry. [4]