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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
Propagation of a ray through a layer. The transfer-matrix method is a method used in optics and acoustics to analyze the propagation of electromagnetic or acoustic waves through a stratified medium; a stack of thin films. [1] [2] This is, for example, relevant for the design of anti-reflective coatings and dielectric mirrors.
Reflectivity of X-rays is low, regardless of the used material and therefore, grazing incidence upon the grating is necessary. X-ray beams impinging on a smooth surface at a few degrees glancing angle of incidence undergo external total reflection which is taken advantage of to enhance the instrumental efficiency substantially.
A ray of light is characterized by the direction normal to the wave front (wave normal). When a ray encounters a surface, the angle that the wave normal makes with respect to the surface normal is called the angle of incidence and the plane defined by both directions is the plane of incidence. Reflection of the incident ray also occurs in the ...
In the diagram on the right, an incident plane wave in the direction of the ray IO strikes the interface between two media of refractive indices n 1 and n 2 at point O. Part of the wave is reflected in the direction OR , and part refracted in the direction OT .
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
Grazing-incidence small-angle scattering (GISAS) a hybrid approach using small scattering (diffraction) angles with X-rays or neutrons. [5] X-ray reflectivity, yet another related technique, but here the intensity of the specular reflected beam is measured. [6] [7] [8]
X-ray optics is the branch of optics dealing with X-rays, rather than visible light. It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction , X-ray crystallography , X-ray fluorescence , small-angle X-ray scattering , X-ray microscopy , X-ray phase-contrast imaging , and X-ray ...