enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. List of temperature sensors - Wikipedia

    en.wikipedia.org/wiki/List_of_temperature_sensors

    The integrated circuit sensor may come in a variety of interfaces — analogue or digital; for digital, these could be Serial Peripheral Interface, SMBus/I 2 C or 1-Wire.. In OpenBSD, many of the I 2 C temperature sensors from the below list have been supported and are accessible through the generalised hardware sensors framework [3] since OpenBSD 3.9 (2006), [4] [5]: §6.1 which has also ...

  3. Intermittent fault - Wikipedia

    en.wikipedia.org/wiki/Intermittent_fault

    A simple example of an effectively random cause in a physical system is a borderline electrical connection in the wiring or a component of a circuit, where (cause 1, the cause that must be identified and rectified) two conductors may touch subject to (cause 2, which need not be identified) a minor change in temperature, vibration, orientation ...

  4. File:16x2 LCD Arduino LM35 temperature sensor.svg - Wikipedia

    en.wikipedia.org/wiki/File:16x2_LCD_Arduino_LM35...

    You are free: to share – to copy, distribute and transmit the work; to remix – to adapt the work; Under the following conditions: attribution – You must give appropriate credit, provide a link to the license, and indicate if changes were made.

  5. Electrical fault - Wikipedia

    en.wikipedia.org/wiki/Electrical_fault

    In an electric power system, a fault or fault current is any abnormal electric current. For example, a short circuit is a fault in which a live wire touches a neutral or ground wire. An open-circuit fault occurs if a circuit is interrupted by a failure of a current-carrying wire (phase or neutral) or a blown fuse or circuit breaker.

  6. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    These can be classified in various ways, such as by time or cause. Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other causes. In semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of the ...

  7. Thermistor - Wikipedia

    en.wikipedia.org/wiki/Thermistor

    An NTC is commonly used as a temperature sensor, or in series with a circuit as an inrush current limiter. With PTC thermistors, resistance increases as temperature rises; usually because of increased thermal lattice agitations, particularly those of impurities and imperfections. PTC thermistors are commonly installed in series with a circuit ...

  8. High-temperature operating life - Wikipedia

    en.wikipedia.org/wiki/High-temperature_operating...

    High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.

  9. Overheating (electricity) - Wikipedia

    en.wikipedia.org/wiki/Overheating_(electricity)

    Circuit-breakers can be placed at portions of a circuit in series to the path of current it will affect. If more current than expected goes through the circuit-breaker, the circuit breaker "opens" the circuit and stops all current. A fuse is a common type of circuit breaker that involves direct effect of Joule-overheating.