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X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
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Unlike the optical spectrum, the X-ray spectrum is quite simple. The strongest line, usually the Kalpha line, but sometimes the Lalpha line, suffices to identify the element. The existence of a particular line betrays the existence of an element, and the intensity is proportional to the amount of the particular element in the specimen.