enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.

  3. X-ray crystal truncation rod - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystal_truncation_rod

    Anode X-ray sources have been successfully used to study gold (=) for example. [4] When doing X-ray measurements of a surface, the sample is held in Ultra-High Vacuum and the X-rays pass into and out of the UHV chamber through Beryllium windows. There are 2 approaches to chamber and diffractometer design that are in use.

  4. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.

  5. X-ray scattering techniques - Wikipedia

    en.wikipedia.org/wiki/X-ray_scattering_techniques

    This is an X-ray diffraction pattern formed when X-rays are focused on a crystalline material, in this case a protein. Each dot, called a reflection, forms from the coherent interference of scattered X-rays passing through the crystal.

  6. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions. The height, width and position of these reflections can be used to determine many ...

  7. X-ray diffraction computed tomography - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction_computed...

    X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .

  8. Grazing incidence diffraction - Wikipedia

    en.wikipedia.org/wiki/Grazing_incidence_diffraction

    RHEED is used to interrogate surface structure. [1] [2] Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [3] X-ray standing waves, another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry. [4]

  9. Three-dimensional X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/Three-dimensional_X-ray...

    To determine the crystallographic orientation of the grains in the considered sample, the following software packages are in use: Fable [8] and GrainSpotter. [9] Reconstructing the 3D shape of the grains is nontrivial and three approaches are available to do so, respectively based on simple back-projection, forward projection, algebraic ...