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MFM images of 3.2 Gb and 30 Gb computer hard-drive surfaces. Comparison of Faraday-effect image (left) and MFM image (inset, lower-right) of a magnetic film. Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the ...
The alternating magnetic field induces an electric field in the pickup coils of the VSM. [4] The current is proportional to the magnetization of the sample - the greater the induced current, the greater the magnetization. As a result, typically a hysteresis curve will be recorded [5] and from there the magnetic properties of the sample can be ...
SGMs were developed in the late 1990s from atomic force microscopes. Most importantly, these had to be adapted for use at low temperatures, often 4 kelvins or less, as the samples under study do not work at higher temperatures. Today an estimated number of eleven research groups worldwide use the technique.
The crystal hosts an N-V center and is attached to the AFM tip. A wire on the sample surface serves as the microwave source (mw). The temperature of the cantilever T h is determined from the applied current and voltage. (b) Optically detected magnetic resonance spectra of the N-V center at three temperatures.
Gaseous deposition on the tip is carried out in an ultrahigh vacuum (5 x 10 −8 mbar) chamber at a low temperature (10K). Depositions of Xe, Kr, NO, CH 4 or CO [52] on tip have been successfully prepared and used for imaging studies. However, these tips preparations rely on the attachment of single atoms or molecules on the tip and the ...
A high temperature Scanning SQUID Microscope using a YBCO SQUID is capable of measuring magnetic fields as small as 20 pT (about 2 million times weaker than the Earth's magnetic field). The SQUID sensor is sensitive enough that it can detect a wire even if it is carrying only 10 nA of current at a distance of 100 μm from the SQUID sensor with ...
Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.
The force at which the bond breaks up is measured. Since mechanical breaking is a kinetic, stochastic process, the breaking force is not an absolute parameter, but it is a function of both temperature and pulling speed. Low temperatures and high pulling speeds correspond to higher breaking forces.
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