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A highly accelerated life test (HALT) is a stress testing methodology for enhancing product reliability in which prototypes are stressed to a much higher degree than expected from actual use in order to identify weaknesses in the design or manufacture of the product. [1]
The ongoing reliability test (ORT) is a hardware test process usually used in manufacturing to ensure that quality of the products is still of the same specifications as the day it first went to production or general availability.
Reliability engineering is a sub-discipline of systems engineering that emphasizes the ability of equipment to function without failure. Reliability is defined as the probability that a product, system, or service will perform its intended function adequately for a specified period of time, OR will operate in a defined environment without failure. [1]
The testing of a production-representative unit to demonstrate that the design, manufacturing, assembly, and repair processes have resulted in hardware that conforms to the specification. Satisfactory completion of Qualification Testing denotes readiness for further stages of testing.
graph with an example of steps in a failure mode and effects analysis. Failure mode and effects analysis (FMEA; often written with "failure modes" in plural) is the process of reviewing as many components, assemblies, and subsystems as possible to identify potential failure modes in a system and their causes and effects.
The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment.
HASA is a form of HASS (highly accelerated stress screening) – a powerful testing tool for improving product reliability, reducing warranty costs and increasing customer satisfaction. Since HASS levels are more aggressive than conventional screening tools, a POS procedure is used to establish the effectiveness in revealing production induced ...
Parts Average Testing is a statistical method for recognizing and quarantining semiconductor die that have a higher probability of reliability failures. This technique identifies characteristics that are within specification but outside of a normal distribution for that population as at-risk outliers not suitable for high reliability applications.