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NOTE: in past decades, a number of AND-OR-invert (AOI) parts were available in 7400 TTL families, but currently most are obsolete. SN5450 = dual 2-2 AOI gate, one is expandable (SN54 is military version of SN74) SN74LS51 = 2-2 AOI gate and 3-3 AOI gate; SN54LS54 = single 2-3-3-2 AOI gate
HCMOS ("high-speed CMOS") is the set of specifications for electrical ratings and characteristics, forming the 74HC00 family, a part of the 7400 series of integrated circuits. [ 1 ] The 74HC00 family followed, and improved upon, the 74C00 series (which provided an alternative CMOS logic family to the 4000 series but retained the part number ...
The first part number in the series, the 7400, is a 14-pin IC containing four two-input NAND gates. Each gate uses two input pins and one output pin, with the remaining two pins being power (+5 V) and ground. This part was made in various through-hole and surface-mount packages, including flat pack and plastic/ceramic dual in-line.
The 74181 is a 7400 series medium-scale integration (MSI) TTL integrated circuit, containing the equivalent of 75 logic gates [3] and most commonly packaged as a 24-pin DIP. The 4-bit wide ALU can perform all the traditional add / subtract / decrement operations with or without carry, as well as AND / NAND, OR / NOR, XOR , and shift .
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.
An Orsat gas analyser or Orsat apparatus is a piece of laboratory equipment used to analyse a gas sample (typically fossil fuel flue gas) for its oxygen, carbon monoxide and carbon dioxide content. Although largely replaced by instrumental techniques, the Orsat remains a reliable method of measurement and is relatively simple to use. [1]
A gate driver is a power amplifier that accepts a low-power input from a controller IC and produces a high-current drive input for the gate of a high-power transistor such as an IGBT or power MOSFET. Gate drivers can be provided either on-chip or as a discrete module. In essence, a gate driver consists of a level shifter in combination with an ...
It is a standard destructive test method used to determine the quality of gate oxides in MOS devices. It is equal to the total charge passing through the dielectric layer (i.e. electron or hole fluence multiplied by the elementary charge) just before failure. Thus QBD is a measure of time-dependent gate oxide breakdown.