enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    Women have written many textbooks and research papers in the field of X-ray crystallography. For many years Lonsdale edited the International Tables for Crystallography, which provide information on crystal lattices, symmetry, and space groups, as well as mathematical, physical and chemical data on structures.

  3. R-factor (crystallography) - Wikipedia

    en.wikipedia.org/wiki/R-factor_(crystallography)

    In other words, it is a measure of how well the refined structure predicts the observed data. [1] The value is also sometimes called the discrepancy index, as it mathematically describes the difference between the experimental observations and the ideal calculated values. [2] It is defined by the following equation:

  4. Extended X-ray absorption fine structure - Wikipedia

    en.wikipedia.org/wiki/Extended_X-ray_absorption...

    Linear combination fitting of several different standard spectra can give an estimate to the amount of each of the known standard spectra within an unknown sample. The dominant physical process in x-ray absorption is one where the absorbed photon ejects a core photoelectron from the absorbing atom, leaving behind a core hole. [ 1 ]

  5. International Centre for Diffraction Data - Wikipedia

    en.wikipedia.org/wiki/International_Centre_for...

    Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects. In 2020, the ICDD and the Cambridge Crystallographic Data Centre, which curates and maintains the Cambridge Structural Database, announced a data partnership.

  6. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    The most common powder X-ray diffraction (XRD) refinement technique used today is based on the method proposed in the 1960s by Hugo Rietveld. [2] The Rietveld method fits a calculated profile (including all structural and instrumental parameters) to experimental data.

  7. Energy-dispersive X-ray spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Energy-dispersive_X-ray...

    A detector is used to convert X-ray energy into voltage signals; this information is sent to a pulse processor, which measures the signals and passes them onto an analyzer for data display and analysis. [citation needed] The most common detector used to be a Si(Li) detector cooled to cryogenic temperatures with liquid nitrogen.

  8. X-ray absorption spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_absorption_spectroscopy

    XAS data is obtained by tuning the photon energy, [3] using a crystalline monochromator, to a range where core electrons can be excited (0.1-100 keV). The edges are, in part, named by which core electron is excited: the principal quantum numbers n = 1, 2, and 3, correspond to the K-, L-, and M-edges, respectively. [ 4 ]

  9. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    This is useful if the sample is too thick for X-rays to transmit through it. The diffracting planes in the crystal are determined by knowing that the normal to the diffracting plane bisects the angle between the incident beam and the diffracted beam. A Greninger chart can be used [30] to interpret the back reflection Laue photograph.