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  2. Surface imperfections (optics) - Wikipedia

    en.wikipedia.org/wiki/Surface_imperfections_(optics)

    These imperfections are part of the surface and cannot be removed by cleaning. Surface quality is characterized either by the American military standard notation (eg "60-40") or by specifying RMS (root mean square) roughness (eg "0.3 nm RMS"). [1] American notation focuses on how visible surface defects are, and is a "cosmetic" specification.

  3. CHKDSK - Wikipedia

    en.wikipedia.org/wiki/CHKDSK

    On Windows NT operating systems, CHKDSK can also check the disk surface for bad sectors and mark them (in MS-DOS 6.x and Windows 9x, this is a task done by Microsoft ScanDisk). The Windows Server version of CHKDSK is RAID -aware and can fully recover data in bad sectors of a disk in a RAID-1 or RAID-5 array if other disks in the set are intact.

  4. Artifact (error) - Wikipedia

    en.wikipedia.org/wiki/Artifact_(error)

    In medical electrophysiological monitoring, artifacts are anomalous (interfering) signals that originate from some source other than the electrophysiological structure being studied.

  5. Automated optical inspection - Wikipedia

    en.wikipedia.org/wiki/Automated_optical_inspection

    An Automated Optical Inspection device. Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew).

  6. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.

  7. Fluorescent penetrant inspection - Wikipedia

    en.wikipedia.org/wiki/Fluorescent_penetrant...

    Fluorescent penetrant inspection (FPI) is a type of dye penetrant inspection in which a fluorescent dye is applied to the surface of a non-porous material in order to detect defects that may compromise the integrity or quality of the part in question. FPI is noted for its low cost and simple process, and is used widely in a variety of industries.

  8. Dye penetrant inspection - Wikipedia

    en.wikipedia.org/wiki/Dye_penetrant_inspection

    Dye penetrant inspection (DP), also called liquid penetrate inspection (LPI) or penetrant testing (PT), is a widely applied and low-cost inspection method used to check surface-breaking defects in all non-porous materials (metals, plastics, or ceramics).

  9. Eddy-current testing - Wikipedia

    en.wikipedia.org/wiki/Eddy-current_testing

    Variations in the electrical conductivity and magnetic permeability of the test object, and the presence of defects causes a change in eddy current and a corresponding change in phase and amplitude that can be detected by measuring the impedance changes in the coil, which is a telltale sign of the presence of defects. [5]