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An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a ...
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [1][2][3] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be ...
An atomic-force microscope with its controlling computer. AFM-IR (atomic force microscope-infrared spectroscopy) or infrared nanospectroscopy is one of a family of techniques [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15] that are derived from a combination of two parent instrumental techniques. AFM-IR combines the chemical analysis power ...
Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the sample surface. Many kinds of magnetic interactions are measured by MFM, including magnetic dipole–dipole ...
[14] [15] [2] The Scanning Tunneling Microscope is used mostly for morphological topological investigation of a clean conductive sample, because it is able to give an image of its surface with atomic resolution. The Atomic Force Microscope is a powerful tool in order to study tribology at a fundamental level.
Bimodal Atomic Force Microscopy (bimodal AFM) is an advanced atomic force microscopy technique characterized by generating high-spatial resolution maps of material properties. Topography, deformation, elastic modulus, viscosity coefficient or magnetic field maps might be generated. Bimodal AFM is based on the simultaneous excitation and ...
Christoph Gerber (born 1942) is a titular professor at the Department of Physics, University of Basel, Switzerland. He is the co-inventor of the atomic force microscope (AFM). He was a founding member and director for scientific communication of the NCCR (National Center of Competence in Research Nanoscale Science).