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ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
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The basic structure of scan include the following set of signals in order to control and observe the scan mechanism. Scan_in and scan_out define the input and output of a scan chain. In a full scan mode usually each input drives only one chain and scan out observe one as well. A scan enable pin is a special signal that is added to a design.
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It catches some defects that other tests, particularly stuck-at logic tests, do not. Drawback: Compared to scan chain testing, Iddq testing is time consuming, and thus more expensive, as is achieved by current measurements that take much more time than reading digital pins in mass production.
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Full table scan occurs when there is no index or index is not being used by SQL. And the result of full scan table is usually slower that index table scan. The situation is that: the larger the table, the slower of the data returns. Unnecessary full-table scan will lead to a huge amount of unnecessary I/O with a process burden on the entire ...