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An RF sweep relates to a receiver which changes its frequency of operation continuously from a minimum frequency to a maximum (or from maximum to minimum). Usually the sweep is performed at a fixed, controllable rate, for example 5 MHz/sec. Some systems use frequency hopping, switching from one frequency of operation to another.
A shaker is a device that excites the object or structure according to its amplified input signal. Several input signals are available for modal testing, but the sine sweep and random frequency vibration profiles are by far the most commonly used signals. Small objects or structures can be attached directly to the shaker table. With some types ...
A sweep generator is a piece of electronic test equipment similar to, and sometimes included on, a function generator which creates an electrical waveform with a linearly varying frequency and a constant amplitude. Sweep generators are commonly used to test the frequency response of electronic filter circuits.
I and V sweeping—Sweep capabilities offer a way to test devices under a range of conditions with different source, delay and measure characteristics. These can include fixed level, linear/log and pulsed sweeps. On-board processor—Some SMUs further improve instrument integration, communication and test time by adding an on-board script ...
The display of a spectrum analyzer has frequency displayed on the horizontal axis and the amplitude on the vertical axis. To the casual observer, a spectrum analyzer looks like an oscilloscope, which plots amplitude on the vertical axis but time on the horizontal axis. In fact, some lab instruments can function either as an oscilloscope or a ...
As with the component testing, another signal being injected into the output of a signal generator can cause intermodulation distortion within the generator. Isolators are included in the test set up as with the component testing. [10] The combined test signal can be injected directly in to the receiver if the antenna is removable.
Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.
Abbreviated Test Language for All Systems (ATLAS) is a specialized programming language for use with automatic test equipment (ATE). It is a compiled high-level computer language and can be used on any computer whose supporting software can translate it into the appropriate low-level instructions .