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As with the ¯ and s and individuals control charts, the ¯ chart is only valid if the within-sample variability is constant. [4] Thus, the R chart is examined before the x ¯ {\displaystyle {\bar {x}}} chart; if the R chart indicates the sample variability is in statistical control, then the x ¯ {\displaystyle {\bar {x}}} chart is examined to ...
This is useful if the sample is too thick for X-rays to transmit through it. The diffracting planes in the crystal are determined by knowing that the normal to the diffracting plane bisects the angle between the incident beam and the diffracted beam. A Greninger chart can be used [30] to interpret the back reflection Laue photograph.
where is the signal mean or expected value and is the standard deviation of the noise, or an estimate thereof. [ note 2 ] Notice that such an alternative definition is only useful for variables that are always non-negative (such as photon counts and luminance ), and it is only an approximation since E [ X 2 ] = σ 2 + μ 2 {\displaystyle ...
As with the ¯ and R and individuals control charts, the ¯ chart is only valid if the within-sample variability is constant. [5] Thus, the s chart is examined before the x ¯ {\displaystyle {\bar {x}}} chart; if the s chart indicates the sample variability is in statistical control, then the x ¯ {\displaystyle {\bar {x}}} chart is examined to ...
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [1] using a laboratory diffractometer and a monochromatic X-ray pencil beam.
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
The instrument detection limit (IDL) is the analyte concentration that is required to produce a signal greater than three times the standard deviation of the noise level. This may be practically measured by analyzing 8 or more standards at the estimated IDL then calculating the standard deviation from the measured concentrations of those standards.
The mean and the standard deviation of a set of data are descriptive statistics usually reported together. In a certain sense, the standard deviation is a "natural" measure of statistical dispersion if the center of the data is measured about the mean. This is because the standard deviation from the mean is smaller than from any other point.