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A scanning helium ion microscope (SHIM, HeIM or HIM) is an imaging technology based on a scanning helium ion beam. [2] Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation at sub-nanometer resolution.
The scanning helium microscope (SHeM) is a form of microscopy that uses low-energy (5–100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces.
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).
Scanning helium microscope may refer to: . Scanning helium microscopy; Scanning Helium Ion Microscope; Atomic nanoscope, which was proposed and discussed in the literature, but is not yet competitive with optical microscope, electron microscope, Scanning Helium Ion Microscope and various scanning probe microscopes
In field ion microscopy, the tip is cooled by a cryogen and its polarity is reversed. When an imaging gas (usually hydrogen or helium) is introduced at low pressures (< 0.1 Pascal) gas ions in the high electric field at the tip apex are field ionized and produce a projected image of protruding atoms at the tip apex. The image resolution is ...
Scanning acoustic microscope; Scanning helium ion microscope; Scanning helium microscopy; Scanning microscopy; Scanning SQUID microscope; Scanning tunneling microscope; Scioptic ball; Sim scanner; Simulated fluorescence process algorithm; Single particle analysis; Spectral signal-to-noise ratio; Stanhope lens; Stereo microscope
amend her job functions, tacking on additional tasks such as tidying the kitchen, light laundry and/or ironing, or other house-keeping duties – without any corresponding increase in pay. The workday usually ended around six o’clock in the evening, provided
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...