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  2. Focused ion beam - Wikipedia

    en.wikipedia.org/wiki/Focused_ion_beam

    Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).

  3. Ion beam analysis - Wikipedia

    en.wikipedia.org/wiki/Ion_beam_analysis

    The configuration of the ion beam apparatus can be changed and made more complex with the incorporation of additional components. The techniques for ion beam analysis are designed for specific purposes. Some techniques and ion sources are shown in table 1. Detector types and arrangements for ion beam techniques are shown in table 2.

  4. Probe tip - Wikipedia

    en.wikipedia.org/wiki/Probe_Tip

    Focused ion and electron beam techniques for the fabrication of strong, stable, reproducible Si 3 N 4 pyramidal tips with 1.0 μm length and 0.1 μm diameter were reported by Russell in 1992. [6] Significant advancement also came through the introduction of micro-fabrication methods for the creation of precise conical or pyramidal silicon and ...

  5. List of materials analysis methods - Wikipedia

    en.wikipedia.org/wiki/List_of_materials_analysis...

    EBIC – Electron beam induced current (see IBIC: ion beam induced charge) EBS – Elastic (non-Rutherford) backscattering spectrometry (see RBS) EBSD – Electron backscatter diffraction; ECOSY – Exclusive correlation spectroscopy; ECT – Electrical capacitance tomography; EDAX – Energy-dispersive analysis of x-rays

  6. Electrostatic lens - Wikipedia

    en.wikipedia.org/wiki/Electrostatic_lens

    An electrostatic lens is a device that assists in the transport of charged particles. [1] [2] [3] For instance, it can guide electrons emitted from a sample to an electron analyzer, analogous to the way an optical lens assists in the transport of light in an optical instrument.

  7. Electron beam-induced deposition - Wikipedia

    en.wikipedia.org/wiki/Electron_beam-induced...

    Electron-beam-induced deposition (EBID) is a process of decomposing gaseous molecules by an electron beam leading to deposition of non-volatile fragments onto a nearby substrate. The electron beam is usually provided by a scanning electron microscope , which results in high spatial accuracy (potentially below one nanometer) and the possibility ...

  8. Nanoscale secondary ion mass spectrometry - Wikipedia

    en.wikipedia.org/wiki/Nanoscale_secondary_ion...

    The ion beam must either be set to detect negative or positive ions, commonly completed by using a cesium+ or oxygen- beam, respectively. [9] The high mass resolution achievable is particularly relevant to biological applications. For example, nitrogen is one of the most common elements in organisms.

  9. Ion beam lithography - Wikipedia

    en.wikipedia.org/wiki/Ion_beam_lithography

    Ion-beam lithography, or ion-projection lithography, is similar to Electron beam lithography, but uses much heavier charged particles, ions. In addition to diffraction being negligible, ions move in straighter paths than electrons do both through vacuum and through matter, so there seems be a potential for very high resolution.