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  2. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  3. Z3 Theorem Prover - Wikipedia

    en.wikipedia.org/wiki/Z3_Theorem_Prover

    Its main applications are extended static checking, test case generation, and predicate abstraction. [citation needed] Z3 was open sourced in the beginning of 2015. [3] The source code is licensed under MIT License and hosted on GitHub. [4] The solver can be built using Visual Studio, a makefile or using CMake and runs on Windows, FreeBSD ...

  4. Stuck-at fault - Wikipedia

    en.wikipedia.org/wiki/Stuck-at_fault

    The test vector is a collection of bits to apply to the circuit's inputs, and a collection of bits expected at the circuit's output. If the gate pin under consideration is grounded, and this test vector is applied to the circuit, at least one of the output bits will not agree with the corresponding output bit in the test vector.

  5. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered ...

  6. Test vector - Wikipedia

    en.wikipedia.org/wiki/Test_vector

    In computer science and engineering, a test vector is a set of inputs provided to a system in order to test that system. In software development , test vectors are a methodology of software testing and software verification and validation .

  7. Test compression - Wikipedia

    en.wikipedia.org/wiki/Test_compression

    Test compression is a technique used to reduce the time and cost of testing integrated circuits.The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design.

  8. We Tried All The Whipped Toppings To Find The Best One For ...

    www.aol.com/tried-whipped-toppings-best-one...

    We wanted to do a taste test of each—both bottle and tub—in tandem, to determine winning brands for each. The Contenders Bottles. Reddi Whip. Land O Lakes Zero Sugar. Kirkland Heavy Whipped Cream.

  9. Pseudorandom number generator - Wikipedia

    en.wikipedia.org/wiki/Pseudorandom_number_generator

    It can be shown that if is a pseudo-random number generator for the uniform distribution on (,) and if is the CDF of some given probability distribution , then is a pseudo-random number generator for , where : (,) is the percentile of , i.e. ():= {: ()}. Intuitively, an arbitrary distribution can be simulated from a simulation of the standard ...