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  2. Mitutoyo - Wikipedia

    en.wikipedia.org/wiki/Mitutoyo

    Mitutoyo America Corporation was formed in 1963 and is headquartered in Aurora, Illinois (just outside Chicago).Mitutoyo America offers the full product line of precision measuring tools, instruments and equipment with a distribution network, training and education classes, software development, and service support to provide a comprehensive metrology organization.

  3. Indicator (distance amplifying instrument) - Wikipedia

    en.wikipedia.org/wiki/Indicator_(distance...

    Ideal test indicator pushed. Prior to modern geared dial mechanisms, test indicators using a single lever or systems of levers were common. The range and precision of these devices were generally inferior to modern dial type units, with a range of 10/1000 inch to 30/1000 inch, and precision of 1/1000 inch being typical.

  4. Micrometer (device) - Wikipedia

    en.wikipedia.org/wiki/Micrometer_(device)

    Vernier micrometer reading 5.783 ± 0.001 mm, comprising 5.5 mm on main screw lead scale, 0.28 mm on screw rotation scale, and 0.003 mm added from vernier. Some micrometers are provided with a vernier scale on the sleeve in addition to the regular graduations. These permit measurements within 0.001 millimetre to be made on metric micrometers ...

  5. Calipers - Wikipedia

    en.wikipedia.org/wiki/Calipers

    The calipers in the diagram show a primary reading on the metric scale of about 2.475 cm (2.4 cm read from the main scale plus about 0.075 cm from the vernier scale). Calipers often have a "zero point error": meaning that the calipers do not read 0.000 cm when the jaws are closed.

  6. Micrometer - Wikipedia

    en.wikipedia.org/wiki/Micrometer

    Main page; Contents; Current events; Random article; About Wikipedia; Contact us; Help; Learn to edit; Community portal; Recent changes; Upload file

  7. 1951 USAF resolution test chart - Wikipedia

    en.wikipedia.org/wiki/1951_USAF_resolution_test...

    A 1951 USAF resolution test chart is a microscopic optical resolution test device originally defined by the U.S. Air Force MIL-STD-150A standard of 1951. The design provides numerous small target shapes exhibiting a stepped assortment of precise spatial frequency specimens.

  8. Micrometre - Wikipedia

    en.wikipedia.org/wiki/Micrometre

    The micrometre (Commonwealth English as used by the International Bureau of Weights and Measures; [1] SI symbol: μm) or micrometer (American English), also commonly known by the non-SI term micron, [2] is a unit of length in the International System of Units (SI) equalling 1 × 10 −6 metre (SI standard prefix "micro-" = 10 −6); that is, one millionth of a metre (or one thousandth of a ...

  9. Thin section - Wikipedia

    en.wikipedia.org/wiki/Thin_section

    Under cross polarized light (XPL) quartz displays low interference colors and is usually the defining mineral used to determine if the thin section is at standardized thickness of 30 microns as quartz will only display up to a very pale yellow interference color and no further at that thickness, and it is very common in most rocks so it will ...

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