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  2. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.

  3. List of Arduino boards and compatible systems - Wikipedia

    en.wikipedia.org/wiki/List_of_Arduino_boards_and...

    BBFuino come with the ATmega328 controller, loaded with Optiboot (Arduino UNO's bootloader), compatible with Arduino IDE and sample code, design to fit breadboard for prototyping and learning, lower down the cost by taking out the USB to UART IC, so the board has the basic component to operate. BlockDuino [161] ATmega8 ATmega328 Blockduino

  4. Navigation Data Standard - Wikipedia

    en.wikipedia.org/wiki/Navigation_Data_Standard

    The NDS standard is documented regarding database structures, interoperability requirements, and update processes. The NDS association provides various tools [6] that can be used by the NDS members to develop and validate maps: NDS SQLite reference engine; Relational DataScript (RDS tool): Code generator for database access classes in Java and C++

  5. Arduino - Wikipedia

    en.wikipedia.org/wiki/Arduino

    Arduino (/ ɑː r ˈ d w iː n oʊ /) is an Italian open-source hardware and software company, project, and user community that designs and manufactures single-board microcontrollers and microcontroller kits for building digital devices.

  6. Bed of nails tester - Wikipedia

    en.wikipedia.org/wiki/Bed_of_nails_tester

    Spring loaded pins are a component of the bed of nails tester. A bed of nails tester is a traditional electronic test fixture used for in-circuit testing.It has pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact with test points on a printed circuit board and are also connected to a measuring unit by wires.

  7. AVR microcontrollers - Wikipedia

    en.wikipedia.org/wiki/AVR_microcontrollers

    The Joint Test Action Group feature provides access to on-chip debugging functionality while the chip is running in the target system. [27] JTAG allows accessing internal memory and registers, setting breakpoints on code, and single-stepping execution to observe system behaviour. Atmel provides a series of JTAG adapters for the AVR:

  8. Catalogue number - Wikipedia

    en.wikipedia.org/wiki/Catalogue_number

    A catalogue number (British English) or catalog number (American English) may refer to: Any number used to identify an item in a catalog (disambiguation) , including: Accession number (disambiguation) , in libraries and museums

  9. Curve tracer - Wikipedia

    en.wikipedia.org/wiki/Curve_tracer

    (Tektronix, Catalog, 1967) A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components, such as diodes, transistors, thyristors, and vacuum tubes. The device contains voltage and current sources that can be used to stimulate the device under test (DUT).