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A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer , then at IBM Zürich , the Nobel Prize in Physics in 1986.
Tunneling applications include the tunnel diode, [5] quantum computing, flash memory, and the scanning tunneling microscope. Tunneling limits the minimum size of devices used in microelectronics because electrons tunnel readily through insulating layers and transistors that are thinner than about 1 nm. [6]
The spin polarized scanning tunneling microscope is a versatile instrument which has gained tremendous attention due to its enhanced surface sensitivity and lateral resolution up to atomic scale, and can be used as an important tool to study ferromagnetic materials, such as dysprosium (Dy), quasi-2D thin films, nano islands and quasi-1D ...
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.
Scanning tunneling spectroscopy (STS), an extension of scanning tunneling microscopy (STM), is used to provide information about the density of electrons in a sample as a function of their energy. In scanning tunneling microscopy, a metal tip is moved over a conducting sample without making physical contact.
The electrochemical scanning tunneling microscope (EC-STM) is a scanning tunneling microscope that measures the structures of surfaces and electrochemical reactions in solid-liquid interfaces at atomic or molecular scales. [1] [2] [3]
Multi-tip scanning tunneling microscopy (Multi-tip STM) extends scanning tunneling microscopy (STM) from imaging to dedicated electrical measurements at the nanoscale like a ″multimeter at the nanoscale″. In materials science, nanoscience, and nanotechnology, it is desirable to measure electrical properties at a particular position of the ...
[14] [15] [2] The Scanning Tunneling Microscope is used mostly for morphological topological investigation of a clean conductive sample, because it is able to give an image of its surface with atomic resolution. The Atomic Force Microscope is a powerful tool in order to study tribology at a fundamental level.