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The multiple-prism dispersion theory is applied to design these beam expanders either in additive configuration, thus adding or subtracting their dispersion to the dispersion of the grating, or in compensating configuration (yielding zero dispersion at a design wavelength) thus allowing the diffraction grating to control the tuning characteristics of the laser cavity. [11]
A typical monochromator achieves this through the use of entrance and exit slits, collimating and focus optics, and a wavelength-dispersing element such as a diffraction grating or prism. [6] Modern monochromators are manufactured with diffraction gratings, and diffraction gratings are used almost exclusively in spectroradiometric applications.
Grating spectrometer schematic Internal structure of a grating spectrometer: Light comes from left side and diffracts on the upper middle reflective grating. The wavelength of light is then selected by the slit on the upper right corner.
A blazed diffraction grating reflecting only the green portion of the spectrum from a room's fluorescent lighting. For a diffraction grating, the relationship between the grating spacing (i.e., the distance between adjacent grating grooves or slits), the angle of the wave (light) incidence to the grating, and the diffracted wave from the grating is known as the grating equation.
An echelle grating (from French échelle, meaning "ladder") is a type of diffraction grating characterised by a relatively low groove density, but a groove shape which is optimized for use at high incidence angles and therefore in high diffraction orders. Higher diffraction orders allow for increased dispersion (spacing) of spectral features at ...
A special form of a blazed grating is the echelle grating. It is characterized by particularly large blaze angle (>45°). Therefore, the light hits the short legs of the triangular grating lines instead of the long legs. Echelle gratings are mostly manufactured with larger line spacing but are optimized for higher diffraction orders.
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A third “probe” laser is incident at a wavelength at which the (complex) index of refraction n is different in the bright and dark regions of the interference pattern, so that the periodic variation in n serves as a diffraction grating for the probe beam. A photodetector is used to measure the diffracted light, and after the pump beams are ...