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X-ray diffraction computed tomography, often abbreviated as XRD-CT, typically refers to the technique invented by Harding et al. [1] which assumes that the acquired data are powder diffraction data. For this reason, it has also been mentioned as powder diffraction computed tomography [ 7 ] and diffraction scattering computed tomography (DSCT ...
Coot can also display electron density, which is the result of structure determination experiments such as X-ray crystallography and EM reconstruction. The density is contoured using a 3D-mesh. The contour level controlled using the mouse wheel for easy manipulation - this provides a simple way for the user to get an idea of the 3D electron ...
PDF-XChange Viewer (now superseded by the PDF-XChange Editor) is a freemium PDF reader for Microsoft Windows. It supports saving PDF forms and importing or exporting form data in FDF/XFDF format. Since version 2.5, there has been partial support for XFA, and exporting form data in XML Data Package (XDP) or XML format.
The primary file format for CSD structure deposition, adopted around 1991, is the "Crystallographic Information file" format, CIF. [16] The deposited CSD files can be downloaded in the CIF format. The validated and curated CSD files can be exported in a wide range of formats, including CIF, MOL, Mol2, PDB, SHELX and XMol, using tools in the CSD ...
Advances in X-ray Analysis—Technical articles on x-ray methods and analyses; Powder Diffraction Journal—quarterly journal published by the JCPDS-International Centre for Diffraction Data through the Cambridge University Press; Denver X-ray Conference—World's largest X-ray conference on the latest advancements in XRD and XRF; PPXRD-16 ...
XAS – X-ray absorption spectroscopy; X-CTR – X-ray crystal truncation rod scattering; X-ray crystallography; XDS – X-ray diffuse scattering; XES – X-ray emission spectroscopy; XPEEM – X-ray photoelectron emission microscopy; XPS – X-ray photoelectron spectroscopy; XRD – X-ray diffraction; XRES – X-ray resonant exchange scattering
The Rigaku MiniFlex is historically significant in that it was the first commercial benchtop (tabletop) X-ray diffraction instrument. When introduced in 1973, the original Miniflex was about one-tenth the size, and dramatically less expensive, than conventional X-ray diffraction equipment of the period.
Compared with destructive techniques, e.g. three-dimensional electron backscatter diffraction (3D EBSD), [5] with which the sample is serially sectioned and imaged, 3DXRD and similar X-ray nondestructive techniques have the following advantages: They require less sample preparation, thus limiting the introduction of new structures in the sample.