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  2. Charge carrier density - Wikipedia

    en.wikipedia.org/wiki/Charge_carrier_density

    Charge carrier density, also known as carrier concentration, denotes the number of charge carriers per volume. In SI units , it is measured in m −3 . As with any density , in principle it can depend on position.

  3. Mass action law (electronics) - Wikipedia

    en.wikipedia.org/wiki/Mass_action_law_(electronics)

    In electronics and semiconductor physics, the law of mass action relates the concentrations of free electrons and electron holes under thermal equilibrium.It states that, under thermal equilibrium, the product of the free electron concentration and the free hole concentration is equal to a constant square of intrinsic carrier concentration .

  4. Band diagram - Wikipedia

    en.wikipedia.org/wiki/Band_diagram

    Band diagram for Schottky barrier at equilibrium Band diagram for semiconductor heterojunction at equilibrium. In solid-state physics of semiconductors, a band diagram is a diagram plotting various key electron energy levels (Fermi level and nearby energy band edges) as a function of some spatial dimension, which is often denoted x. [1]

  5. Valence and conduction bands - Wikipedia

    en.wikipedia.org/wiki/Valence_and_conduction_bands

    In solid-state physics, the valence band and conduction band are the bands closest to the Fermi level, and thus determine the electrical conductivity of the solid. In nonmetals, the valence band is the highest range of electron energies in which electrons are normally present at absolute zero temperature, while the conduction band is the lowest range of vacant electronic states.

  6. Diffusion current - Wikipedia

    en.wikipedia.org/wiki/Diffusion_current

    Diffusion current is a current in a semiconductor caused by the diffusion of charge carriers (electrons and/or electron holes).This is the current which is due to the transport of charges occurring because of non-uniform concentration of charged particles in a semiconductor.

  7. Spreading resistance profiling - Wikipedia

    en.wikipedia.org/wiki/Spreading_Resistance_Profiling

    The tool is used primarily for determining doping structures in silicon semiconductors. Deep and shallow profiles are shown in Figure 2. Figure 2 The shallow profile on the left, the deep profile on the right. Carrier concentration is plotted against depth. Regions with a net electron concentration are denoted as "n" (or n-type).

  8. Fermi level - Wikipedia

    en.wikipedia.org/wiki/Fermi_level

    The Fermi level of a solid-state body is the thermodynamic work required to add one electron to the body. It is a thermodynamic quantity usually denoted by μ or E F [ 1 ] for brevity. The Fermi level does not include the work required to remove the electron from wherever it came from.

  9. Moss–Burstein effect - Wikipedia

    en.wikipedia.org/wiki/Moss–Burstein_effect

    [1] [2] The effect occurs when the electron carrier concentration exceeds the conduction band edge density of states, which corresponds to degenerate doping in semiconductors. In nominally doped semiconductors, the Fermi level lies between the conduction and valence bands. For example, in n-doped semiconductor, as the doping concentration is ...