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  2. Axiomatic product development lifecycle - Wikipedia

    en.wikipedia.org/wiki/Axiomatic_product...

    Black-box testing is the software analog to FTC. At the end of the system development, a functional test verifies that the requirements of the system are met. Component Test Cases (CTC) are a physical analog to White-box testing. CTC verify that components satisfy the allocated FRs and ICs.

  3. Device under test - Wikipedia

    en.wikipedia.org/wiki/Device_under_test

    In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.

  4. Assembly modelling - Wikipedia

    en.wikipedia.org/wiki/Assembly_modelling

    Assembly modeling is a technology and method used by computer-aided design and product visualization computer software systems to handle multiple files that represent components within a product. [1] The components within an assembly are represented as solid or surface models.

  5. Failure mode and effects analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_mode_and_effects...

    graph with an example of steps in a failure mode and effects analysis. Failure mode and effects analysis (FMEA; often written with "failure modes" in plural) is the process of reviewing as many components, assemblies, and subsystems as possible to identify potential failure modes in a system and their causes and effects.

  6. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    While in-circuit test is a very powerful tool for testing PCBs, it has these limitations: Parallel components can often only be tested as one component if the components are of the same type (i.e. two resistors); though different components in parallel may be testable using a sequence of different tests - e.g. a DC voltage measurement versus a measurement of AC injection current at a node.

  7. Failure modes, effects, and diagnostic analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_Modes,_Effects...

    All components of a design, The functionality of each component, The failure modes of each component, The effect of each component failure mode on the product functionality, The ability of any automatic diagnostics to detect the failure, The design strength (de-rating, safety factors), The impact of any latent fault tests, and

  8. Integration testing - Wikipedia

    en.wikipedia.org/wiki/Integration_testing

    However, if the test cases and their results are not recorded properly, the entire integration process will be more complicated and may prevent the testing team from achieving the goal of integration testing. In bottom-up testing, the lowest level components are tested first, and are then used to facilitate the testing of higher level components.

  9. Educational assessment - Wikipedia

    en.wikipedia.org/wiki/Educational_assessment

    The former, used widely in education, predicts the score a student would get on a similar test but with different questions. The latter, used widely in the workplace, predicts performance. Thus, a subject-matter-valid test of knowledge of driving rules is appropriate while a predictively valid test would assess whether the potential driver ...