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Mean time between failures (MTBF) is the predicted elapsed time between inherent failures of a mechanical or electronic system during normal system operation. MTBF can be calculated as the arithmetic mean (average) time between failures of a system. The term is used for repairable systems while mean time to failure (MTTF) denotes the expected ...
The Weibull plot is a plot of the empirical cumulative distribution function of data on special axes in a type of Q–Q plot. The axes are versus . The reason for this change of variables is the cumulative distribution function can be linearized: which can be seen to be in the standard form of a straight line.
Nash–Sutcliffe model efficiency coefficient. The Nash–Sutcliffe model efficiency coefficient (NSE) is used to assess the predictive skill of hydrological models. It is defined as: where is the mean of observed discharges, and is modeled discharge. is observed discharge at time t. [1]
Fisher's exact test is a statistical significance test used in the analysis of contingency tables. [1][2][3] Although in practice it is employed when sample sizes are small, it is valid for all sample sizes. It is named after its inventor, Ronald Fisher, and is one of a class of exact tests, so called because the significance of the deviation ...
Exponential decay. A quantity undergoing exponential decay. Larger decay constants make the quantity vanish much more rapidly. This plot shows decay for decay constant ( λ) of 25, 5, 1, 1/5, and 1/25 for x from 0 to 5. A quantity is subject to exponential decay if it decreases at a rate proportional to its current value.
Failure rate is the frequency with which an engineered system or component fails, expressed in failures per unit of time. It is usually denoted by the Greek letter λ (lambda) and is often used in reliability engineering. The failure rate of a system usually depends on time, with the rate varying over the life cycle of the system.
Survival analysis is a branch of statistics for analyzing the expected duration of time until one event occurs, such as death in biological organisms and failure in mechanical systems. This topic is called reliability theory, reliability analysis or reliability engineering in engineering, duration analysis or duration modelling in economics ...
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.