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  2. Patentscope - Wikipedia

    en.wikipedia.org/wiki/Patentscope

    PATENTSCOPE is a global patent database and search system developed and maintained by the World Intellectual Property Organization. It provides free and open access to a vast collection of international patent documents, including patent applications, granted patents, and related technical information.

  3. United States Patent and Trademark Office - Wikipedia

    en.wikipedia.org/wiki/United_States_Patent_and...

    The X generally appears at the end of the numbers hand-written on full-page patent images; however, in patent collections and for search purposes, the X is considered to be the patent type – analogous to the "D" of design patents – and appears at the beginning of the number. The X distinguishes the patents from those issued after the fire ...

  4. Derwent World Patents Index - Wikipedia

    en.wikipedia.org/wiki/Derwent_World_Patents_Index

    The Derwent World Patents Index (DWPI) is a database containing patent applications and grants from 44 of the world's patent issuing authorities. [1] [2]Compiled in English by editorial staff, the database provides a short abstract detailing the nature and use of the invention described in a patent and is indexed into alphanumeric technology categories to allow retrieval of relevant patent ...

  5. World Intellectual Property Indicators - Wikipedia

    en.wikipedia.org/wiki/World_Intellectual...

    World Intellectual Property Indicators (WIPI) is an annual statistical report published by the World Intellectual Property Organization (WIPO). [1] The publication provides an overview of the activity in the areas of patents, utility models, trademarks, industrial designs, microorganisms, plant variety protection, geographical indications and the creative economy.

  6. Patent analysis - Wikipedia

    en.wikipedia.org/wiki/Patent_analysis

    Patent analysis is the process of analyzing the texts of patent disclosures and other information (such as priority dates, filing and issuance countries, patent maintenance payments, patent citations, patent infringement actions etc.) from the patent lifecycle. Patent analysis is used to obtain deeper insights into different technologies and ...

  7. Template:US patent reference - Wikipedia

    en.wikipedia.org/wiki/Template:US_patent_reference

    number (required) is a patent number, without leading "US" letters, but with leading "D" letter if patent number contains it, and is required. issue-date (optional) is the date of issuing (granting). inventor (optional) is a name of inventor; it can be a wiki-link, of course. title (optional) is the title of the patent.

  8. Content Authenticity Initiative - Wikipedia

    en.wikipedia.org/wiki/Content_Authenticity...

    Users seeing that content on social media can examine such a file with an online tool offered by the CAI [12] or, if present, with C2PA-compliant inspection tools offered by the social media site. Standard-compliant tools will detect whether there were any unauthorized modifications to the file or the metadata.

  9. Espacenet - Wikipedia

    en.wikipedia.org/wiki/Espacenet

    Espacenet (formerly stylized as esp@cenet) [1] [2] is a free online service for searching patents and patent applications. Espacenet was developed by the European Patent Office (EPO) together with the member states of the European Patent Organisation .