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Thermochemical nanolithography (TCNL) or thermochemical scanning probe lithography (tc-SPL) is a scanning probe microscopy-based nanolithography technique which triggers thermally activated chemical reactions to change the chemical functionality or the phase of surfaces.
Thermal polymer decomposition. Thermal scanning probe lithography (t-SPL) is a form of scanning probe lithography [1] (SPL) whereby material is structured on the nanoscale using scanning probes, primarily through the application of thermal energy.
Scanning probe lithography [1] (SPL) describes a set of nanolithographic methods to pattern material on the nanoscale using scanning probes. It is a direct-write, mask-less approach which bypasses the diffraction limit and can reach resolutions below 10 nm. [ 2 ]
Electro Scan was founded in October 2011 by Chuck Hansen in Sacramento, California. [4] In 2012, the Water Environment Research Foundation approved a testing project in Wauwatosa, Wisconsin, in which the company used its technology to check non-conductive sewer pipes that had previously been inspected for leaks using other methods. [5]
In the product scan, the first quadrupole Q 1 is set to select an ion of a known mass, which is fragmented in q 2. The third quadrupole Q 3 is then set to scan the entire m/z range, giving information on the sizes of the fragments made. The structure of the original ion can be deduced from the ion fragmentation information.
Solid-solid conduction. Probe tip to sample. This is the transfer mechanism which yields the thermal scan. Liquid-liquid conduction. When scanning in non-zero humidity, a liquid meniscus forms between the tip and sample. Conduction can occur through this liquid drop. Gas conduction. Heat can be transferred through the edges of the probe tip to ...
The schematic representation of a nano-FTIR system with a broadband infrared source. Nano-FTIR (nanoscale Fourier transform infrared spectroscopy) is a scanning probe technique that utilizes as a combination of two techniques: Fourier transform infrared spectroscopy (FTIR) and scattering-type scanning near-field optical microscopy (s-SNOM).
In microscopy, scanning joule expansion microscopy (SJEM) is a form of scanning probe microscopy heavily based on atomic force microscopy (AFM) that maps the temperature distribution along a surface. Resolutions down to 10 nm have been achieved [ 1 ] and 1 nm resolution is theoretically possible.