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  2. X-ray reflectivity - Wikipedia

    en.wikipedia.org/wiki/X-ray_reflectivity

    X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.

  3. X-ray scattering techniques - Wikipedia

    en.wikipedia.org/wiki/X-ray_scattering_techniques

    X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...

  4. File:Ray optics diagram incidence reflection and refraction.svg

    en.wikipedia.org/wiki/File:Ray_optics_diagram...

    The following other wikis use this file: Usage on bn.wikipedia.org আলোকরশ্মি; Usage on bn.wikibooks.org উইকিশৈশব:ইংরেজি বর্ণমালায় বিজ্ঞান/R

  5. X-ray optics - Wikipedia

    en.wikipedia.org/wiki/X-ray_optics

    X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.

  6. X-ray spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_spectroscopy

    An X-ray spectrograph consists of a high voltage power supply (50 kV or 100 kV), a broad band X-ray tube, usually with a tungsten anode and a beryllium window, a specimen holder, an analyzing crystal, a goniometer, and an X-ray detector device. These are arranged as shown in Fig. 1.

  7. Specular reflection - Wikipedia

    en.wikipedia.org/wiki/Specular_reflection

    The law of reflection states that a reflected ray of light emerges from the reflecting surface at the same angle to the surface normal as the incident ray, but on the opposing side of the surface normal in the plane formed by the incident and reflected rays. This behavior was first described by Hero of Alexandria (AD c. 10–70). [2]

  8. Grazing incidence diffraction - Wikipedia

    en.wikipedia.org/wiki/Grazing_incidence_diffraction

    X-ray reflectivity, yet another related technique, but here the intensity of the specular reflected beam is measured. [ 6 ] [ 7 ] [ 8 ] Grazing incidence atom scattering, [ 9 ] [ 10 ] where the fact that atoms (and ions) can also be waves is used to diffract from surfaces.

  9. Ewald's sphere - Wikipedia

    en.wikipedia.org/wiki/Ewald's_sphere

    The energy of the waves (electron, neutron or x-ray) depends upon the magnitude of the wavevector, so if there is no change in energy (elastic scattering) these have the same magnitude, that is they must all lie on the Ewald sphere. In the Figure the red dot is the origin for the wavevectors, the black spots are reciprocal lattice points ...

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