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A charged device model (CDM) test is used to define the ESD a device can withstand when the device itself has an electrostatic charge and discharges due to metal contact. This discharge type is the most common type of ESD in electronic devices and causes most of the ESD damages in their manufacturing.
The publication describes requirements, levels and test methods to achieve immunity compliance of an electronic product. The purpose is to create a reproducible ground for product compliance and the standard defines: ranges, levels, test equipment, setups, procedures, calibrations, generator waveforms and general uncertainties.
Symbol for an ESD protection device – EPA Alternate warning symbol Symbol of an ESD grounding point for all components. An electrostatic-sensitive device (often abbreviated ESD) is any component (primarily electrical) which can be damaged by common static charges which build up on people, tools, and other non-conductors or semiconductors. [1]
The charged-device model (CDM) is a model for characterizing the susceptibility of an electronic device to damage from electrostatic discharge (ESD). The model is an alternative to the human-body model (HBM). Devices that are classified according to CDM are exposed to a charge at a standardized voltage level, and then tested for survival.
Warning label for an electrostatic sensitive device, denoting the devices susceptibility to damage. A similar symbol without the bar and with a black "dome" denotes ESD-safe equipment. The human-body model (HBM) is the most commonly used model for characterizing the susceptibility of an electronic device to damage from electrostatic discharge ...
An antistatic device is any device that reduces, dampens, or otherwise inhibits electrostatic discharge, or ESD, which is the buildup or discharge of static electricity. [ 1 ] [ 2 ] ESD can damage electrical components such as computer hard drives, and even ignite flammable liquids and gases.
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In electrical engineering, transmission-line pulse (TLP) is a way to study integrated circuit technologies and circuit behavior in the current and time domain of electrostatic discharge (ESD) events. The concept was described shortly after WWII in pp. 175–189 of Pulse Generators , Vol. 5 of the MIT Radiation Lab Series.