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Glass chart. A 1951 USAF resolution test chart is a microscopic optical resolution test device originally defined by the U.S. Air Force MIL-STD-150A standard of 1951. The design provides numerous small target shapes exhibiting a stepped assortment of precise spatial frequency specimens.
Image of pollen grains taken on a SEM shows the characteristic depth of field of SEM micrographs M. von Ardenne's first SEM SEM with opened sample chamber Analog type SEM. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.
Fungal spores in lemon grass leaf, SE image, ElectroScan E3 ESEM Piece of a crystallized polystyrene latex, SE image with ElectroScan 2020 ESEM The environmental scanning electron microscope ( ESEM ) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet , uncoated , or ...
Closeup of the scales of the same specimen. High magnification of the coloured scales (probably a different species). Electron microscopic images: A patch of wing: Scales close up: A single scale: Microstructure of a scale: Magnification: Approx. ×50 Approx. ×200 ×1000 ×5000
[1] [2] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2-bonded carbon (e.g., graphene, C nanotubes). While this term is often also used to refer to high resolution scanning transmission electron microscopy, mostly in high angle annular dark field mode, this ...
Here f(m, n) is the pixel intensity or the gray-scale value at a point (m, n) in the original image, g(m, n) is the gray-scale value at a point (m, n) in the translated image, ¯ and ¯ are mean values of the intensity matrices f and g respectively.
Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is most commonly used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties.
Taylor cone formation and the main forces acting on the solution, adapted from [1] [2].. Scanning electron microscopy image of electrospun polycaprolactone fibers. Photograph of a meniscus of polyvinyl alcohol in aqueous solution showing a fibre being electrospun from a Taylor cone.