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The first modern electrical refrigerator to see widespread use was the General Electric "Monitor-Top" refrigerator, introduced in 1927, and refrigerators became common in the United States in the 1930s. Regardless of the cooling technology, doors on the units were sealed shut using a mechanical latch. [3]
Within the field of electronics Level-sensitive scan design (LSSD) is part of an integrated circuit manufacturing test process. It is a DFT scan design method which uses separate system and scan clocks to distinguish between normal and test mode. Latches are used in pairs, each has a normal data input, data output and clock for system operation.
The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.
To prevent access to the inside of an electric kiln, a trapped key system may be used to interlock a disconnecting switch and the kiln door. While the switch is turned on, the key is held by the interlock attached to the disconnecting switch. To open the kiln door, the switch is first opened, which releases the key.
Three point lock are also commonly used in wardrobes, like from Hettich [6] [7] Single-point locking may provide adequate security for some situations on tiered lockers, as the doors are shorter, and therefore more difficult to force open; however, the taller doors of full length lockers and cabinets are more susceptible to the application of leverage.
IBM Engineering Requirements Management DOORS (Dynamic Object Oriented Requirements System) (formerly Telelogic DOORS, then Rational DOORS) is a requirements management tool. [4] It is a client–server application, with a Windows-only client and servers for Linux, Windows, and Solaris. There is also a web client, DOORS Web Access.
The MIL-STD-883 standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within military and aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and ...
The Via PUF based Hardware RoT (Root of Trust) chips are currently applied in various markets such as telecommunications, appliances, and IoT devices in the forms of Wifi/BLE modules, smart door locks, IP cameras, IR sensor hub, etc. The technology supports the security functionalities such as anti-counterfeiting, secure boot, secure firmware ...