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Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...
The impact of any latent fault tests, and The operational profile (environmental stress factors). Given a component database calibrated with field failure data that is reasonably accurate, [ 1 ] the method can predict device level failure rate per failure mode, useful life, automatic diagnostic effectiveness, and latent fault test effectiveness ...
Fault detection coverage that system built-in test will realize; Whether the analysis will be functional or piece-part; Criteria to be considered (mission abort, safety, maintenance, etc.) System for uniquely identifying parts or functions; Severity category definitions
The construction of a failure detector is an essential, but a very difficult problem that occurred in the development of the fault-tolerant component in a distributed computer system. As a result, the failure detector was invented because of the need for detecting errors in the massive information transaction in distributed computing systems.
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
In the nominal, i.e. fault-free situation, the lower control loop operates to meet the control goals. The fault-detection (FDI) module monitors the closed-loop system to detect and isolate faults. The fault estimate is passed to the reconfiguration block, which modifies the control loop to reach the control goals in spite of the fault.
Failure analysis is the process of collecting and analyzing data to determine the cause of a failure, often with the goal of determining corrective actions or liability.. According to Bloch and Geitner, ”machinery failures reveal a reaction chain of cause and effect… usually a deficiency commonly referred to as the symptom…”
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state (when the circuit is not switching and inputs are held at static values).